AFM原子力显微镜探针(AFM 探针)

AppNano-AFM(AFM 探针)

AppNano-AFM 原子力显微镜探针(AFM 探针)

Silicon Probes(AFM 探针)

Both cantilever & tip are Si(AFM 探针)

SILICON NITRIDE PROBES(AFM 探针)

SiN cantilever with Si or SiN tip(AFM 探针)

ACCESS Tip-View Probes(AFM 探针)

Allows direct view of the tip as it images the sample(AFM 探针)

Conductive Probes(AFM 探针)

Conductive probes for EFM, MFM(AFM 探针)

QUANTITATIVE FORCE SPECTROSCOPY(AFM 探针)

Quantitative force spectroscopy(AFM 探针)

High Aspect Ratio Tip (HART)(AFM 探针)

Deep trench metrology(AFM 探针)

STM Products(AFM 探针)

AppNano also offers high quality STM probes and STM tip etcher.(AFM 探针)

SICONGG(AFM 探针)

此款有10支装、20支装、50支装、200支装、410支-424支装（wafer）(AFM 探针)

SHOCONGG导电探针(AFM 探针)

NITRA-TALL-R-G(AFM 探针)

常用包装数量10支装、20支装、50支装(AFM 探针)

ACCESS-NC-GG(AFM 探针)

AppNano ACCESS™-NC-GG probes are sharp silicon probes for tapping / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Reflex and tip sides are coated with gold.(AFM 探针)