SiNi (AFM 探针)

Application: Soft Contact Mode

This competitively priced silicon nitride AFM probe features:

  • 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip
  • silicon nitride wedge tip
  • overall tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
  • macroscopic half cone angle of 35°
  • 450 micron thick silicon holder chip

Coating

Gold/Chromium on detector side of the cantilever, 70 nm thick

AFM Tip

SHAPE
Pyramid
HEIGHT
12 µm 
(10 - 14 µm)*
RADIUS
< 15 nm
HALF CONE ANGLE
35° (macroscopic)

 

 

4 AFM Cantilevers

Short Cantilever
 Triangle
 0.27 N/m
 30 kHz
 100 µm (90 - 110 µm)*
 16 µm (11 - 21 µm)*
 520 nm (470 - 570 nm)*
Long Cantilever
 Triangle
 0.06 N/m
 10 kHz
 200 µm (190 - 210 µm)*
 30 µm (25 - 35 µm)*
 520 nm (470 - 570 nm)*
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budgetsensors 探针型录 123KB
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