OMCL-AC55TS、高速扫描探针、快扫探针、扫描探针、高频探针
OmegaLever的突出特点
1.用于高速测量的兆赫共振频率 2.低热噪声振动,达到前所未有的分辨率 1.6MHz的高共振频率使快速扫描测量成为可能。
它可以大大实现节省您的AFM数据采集时间。
低热噪声振动,达到前所未有的分辨率
Data courtesy of Dr. K. Miyata & T. Fukuma, Kanazawa Univ.
广受好评的“可视化”针尖
反射层金涂层
More about OmegaLever
1. Mega Hz resonance for high speed measurement
The high resonance frequency with 1.6 MHz (Nominal) enables fast scanning measurement.
It can achieve to save your time of AFM data acquisition.
- *For the use of OmegaLever, bandwidth with 2.5 MHz or above is required for the SPM sensor circuit.
X line scanning 20 Hz
Kraton (SEBS) sample courtesy of Wendy van Zoelen and Rachel Segalman, UC Berkeley.
Topography and Phase imaged with Cypher AFM courtesy of Asylum Research
2. Low thermal noise vibration for unprecedented resolution
It's low thermal noise of cantilever vibration enables high resolution measurement, which attributed to its high resonance frequency and high spring constant. It is worth while trying material research such as liquid-solid interface measurement.
Data courtesy of Dr. K. Miyata & T. Fukuma, Kanazawa Univ.
3. Ideally point terminated probe
The apex of the tetrahedral probe is ideally point terminated.
The tetrahedral probe shows good symmetry viewed from the front. Considering the geometric feature, choose the fast scan (X) direction. Check Scan line profile and enlarged view of the tip apex.
4. Acclaimed ‘Tip View’ structure
The probe can be easily positioned at the exact point of your interest due to ‘Tip View’ structure.
The probe is located at the exact end of the cantilever so that the probe apex is not obscured during optical observations.
5. Reflex side gold coating
Thin gold film with the thickness of 70 nm is coated on the cantilever for reflecting light from the deflection sensor in the AFM equipment. High reflex for high S/N sensing can be expected
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