HQ:CSC 接触模式探针(AFM 探针)
Hi’Res-C probes have a diamond-like spike on the apex of the silicon tip. The sharpness of the spike determines the resolution.
*The spike is not coated!
APPLICATION
Hi'Res-C probes suffer less contamination than silicon SPM probes and allow obtaining many high-resolution scans when proper care is taken during use. Due to the small tip curvature radius, the tip-sample attraction force is minimized.
The advantages of the Hi'Res-C probes are noticeable when scanning smaller areas (<250 nm) and flat samples. On larger images, the resolution is similar to that of general purpose probes. The Hi'Res-C probes are not suitable for corrugated samples.
3-CANTILEVERS SERIES
| Cantilever | Resonance Frequency, kHz | Force Constant, N/m | |||||
|---|---|---|---|---|---|---|---|
| min | typical | max | min | typical | max | ||
| 35 series | Cantilever A | 130 | 205 | 290 | 2.7 | 8.9 | 24 |
| Cantilever B | 185 | 300 | 430 | 4.8 | 16 | 44 | |
| Cantilever C | 95 | 150 | 205 | 1.7 | 5.4 | 14 | |
| 36 series | Cantilever A | 30 | 90 | 160 | 0.1 | 1.0 | 4.6 |
| Cantilever B | 45 | 130 | 240 | 0.2 | 2 | 9 | |
| Cantilever C | 25 | 65 | 115 | 0.06 | 0.6 | 2.7 | |
| 37 series | Cantilever A | 30 | 40 | 55 | 0.3 | 0.8 | 2 |
| Cantilever B | 15 | 20 | 30 | 0.1 | 0.3 | 0.6 | |
| Cantilever C | 20 | 30 | 40 | 0.1 | 0.4 | 1 | |
| 38 series | Cantilever A | 8 | 20 | 32 | 0.01 | 0.09 | 0.36 |
| Cantilever B | 5 | 10 | 17 | 0.003 | 0.03 | 0.13 | |
| Cantilever C | 6 | 14 | 23 | 0.005 | 0.05 | 0.21 | |
| 型号 | 概述 | 询价数量 |
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