HI`RES-C 超高解析度探针(AFM 探针)

Typical spike radius : 1 nm

Spike height : 100 - 200 nm

Total tip height : 12 - 18 µm

Probe material : n-type silicon

Probe bulk resistivity : 0.01 - 0.025 Ohm*cm

Detector coating : Gold

Hi’Res-C probes have a diamond-like spike on the apex of the silicon tip. The sharpness of the spike determines the resolution.

*The spike is not coated!

APPLICATION

Hi'Res-C probes suffer less contamination than silicon SPM probes and allow obtaining many high-resolution scans when proper care is taken during use. Due to the small tip curvature radius, the tip-sample attraction force is minimized.

The advantages of the Hi'Res-C probes are noticeable when scanning smaller areas (<250 nm) and flat samples. On larger images, the resolution is similar to that of general purpose probes. The Hi'Res-C probes are not suitable for corrugated samples.

1-CANTILEVER SERIES

Cantilever Resonance Frequency, kHz Force Constant, N/m
min typical max min typical max
14 series 110 160 220 1.8 5.0 13
15 series 265 325 410 20 40 80
16 series 170 190 210 30 45 70
17 series 10 13 17 0.06 0.18 0.40
18 series 60 75 90 1.2 2.8 5.5
19 series 25 65 120 0.05 0.5 2.3

 

4-CANTILEVERS SERIES

Cantilever Resonance Frequency, kHz Force Constant, N/m
min typical max min typical max
11 series Cantilever A 12 15 18 0.1 0.2 0.4
Cantilever B 60 80 100 1.1 2.7 5.6
Cantilever C 115 155 200 3 7 16
Cantilever D 250 350 465 17 42 90
说明 档案大小 下载
mikromasch 探针型录 123KB
型号 概述 询价数量