APEX SHARP (AFM 探针)
锋利的导电钻石探针
高导电性 Super Sharp 和 Apex Sharp 金刚石探针由独特的专利工艺制成，可确保最佳的纳米机械和电气性能。这些尖端比任何其他电子 AFM 探头更锋利，使用寿命更长。导电金刚石涂层高度掺杂硼，导致宏观电阻率为 0.003 - 0.005 Ohm∙cm。接触电阻通常为 10 kΩ，具体取决于在银表面上测量的接触半径。通过使用耐磨的锋利金刚石探头，接触尺寸得到了很好的表征，并在机械测量过程中保持不变。这些探头已经证明了连续使用超过 24 小时的定量和可重复测量。在悬臂的检测器侧沉积金反射涂层以提高反射率。
成像模式：接触模式、敲击模式、调幅、调频、真正的非接触模式、LFM、纳米操作等。
电气模式：C-AFM、SCM、PFM、EFM、KPFM、PeakForce-KPFM™、TUNA、PeakForce-TUNA™、SSRM、STM、光刻、SRM、ResiScope™、Soft-ResiScope™、HD-KFM™等。
纳米力学模式：PeakForce-QNM™、AMFM 模式、接触共振、QI™ 模式、PinPoint™ 纳米力学模式、HybriD 模式™、纳米压痕
APEX SHARP
Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. By using wear-resistant sharp diamond probes the tip-sample contact size is well characterized and stays constant during mechanical and electrical measurements leading to more reliable data.
- Highly doped with boron with a macroscopic resistivity of 0.003 - 0.005 Ohm∙cm.
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Typical contact resistance of 10 kΩ depending on contact radius (measured on a silver surface).
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Gold reflex coating on the detector side of the cantilever to enhance reflectivity.
Minimum quantity: 5.
Volume discounts:
20-pack = 5 % 50-pack = 10 % 100-pack = 20 % 200-pack = 30 %
Probes are always shipped as 5 probes per box.
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