CONE PROBES (AFM 探针) 纳米压痕 刻划探针 刻蚀针尖

锥形探针

FM-LC 和 NCH-LC 探头是一种新的锥形尖端，可为您提供高分辨率的金刚石优势，并且没有与竞争对手的金刚石涂层产品相关的尖端形状的可变性。 这些探头非常适合低浮雕样品的长寿命成像。 它们还具有导电性，接触电阻在 100 kOhm 范围内。

成像模式：接触模式、敲击模式、调幅、调频、真正的非接触模式、LFM、纳米操作等。

电气模式：C-AFM、SCM、PFM、EFM、KPFM、PeakForce-KPFM™、TUNA、PeakForce-TUNA™、SSRM、STM、光刻、SRM、ResiScope™、Soft-ResiScope™、HD-KFM™等。

 

CONE 

Cone shaped probes offer a cost effective solution ideally suited to the long lifetime imaging of low relief samples. These probes offer the lifetime and nanomechanical advantages of diamond at higher resolution and without the variability in tip shape associated with competing diamond coated products. Boron doped diamond makes these probes conductive with a contact resistance of around 100 kΩ depending on contact radius (measured on a silver surface).

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  • Gold reflex coating on the detector side of the cantilever to enhance reflectivity.

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Minimum quantity: 5.

Volume discounts:
20-pack = 5 % 50-pack = 10 % 100-pack = 20 % 200-pack = 30 %

Probes are always shipped as 5 probes per box.

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