SUPER SHARP (AFM 探针)

Super Sharp 钻石探针能够直接开箱即用地进行原子分辨率的地形和电子成像。 这些尖端提供了市场上最高的电气分辨率。 通过使用耐磨的锋利钻石探针，可以很好地表征尖端-样品接触尺寸，并在机械和电气测量期间保持恒定，从而获得更可靠的数据。

SUPER SHARP

Super Sharp diamond probes are capable of atomic resolution topographical and electrical imaging straight out of the box. These tips offer the highest electrical resolution on the market. By using wear-resistant sharp diamond probes the tip-sample contact size is well characterized and stays constant during mechanical and electrical measurements leading to more reliable data.

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  • Highly doped with boron with a macroscopic resistivity of 0.003 - 0.005 Ohm∙cm.

  • Typical contact resistance of 10 kΩ depending on contact radius (measured on a silver surface).

  • Gold reflex coating on the detector side of the cantilever to enhance reflectivity.

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Minimum quantity: 5.

Volume discounts:
20-pack = 5 % 50-pack = 10 %

Probes are always shipped as 5 probes per box.

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