Tap300Al-G (AFM 探针)
Application: Tapping Mode, Intermittent Contact Mode
Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
For measurements in liquids please use the back side gold coated Tap300GD-G or the overall gold coated Tap300GB-G!
Coating
Aluminium reflex coating on detector side of the cantilever, 30 nm thick
AFM Tip
SHAPE
Rotated
HEIGHT
17 µm
(15 - 19 µm)*
(15 - 19 µm)*
SETBACK
15 µm
(10 - 20 µm)*
(10 - 20 µm)*
RADIUS
< 10 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
AFM Cantilever
Cantilever A
Beam
40 N/m (20 - 75 N/m)*
300 kHz (200 - 400 kHz)*
125 µm (115 - 135 µm)*
30 µm (25 - 35 µm)*
4 µm (3 - 5 µm)*
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