Multi75Al-G (AFM 探针)
Application: Force Modulation Mode, Light Tapping Mode, Pulsed Force Mode (PFM)
Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM).
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
For measurements in liquids please use the back side gold coated Multi75GD-G or the overall gold coated Multi75GB-G!
Coating
Aluminium reflex coating on detector side of the cantilever, 30 nm thick
AFM Tip
SHAPE
Rotated
HEIGHT
17 µm
(15 - 19 µm)*
(15 - 19 µm)*
SETBACK
15 µm
(10 - 20 µm)*
(10 - 20 µm)*
RADIUS
< 10 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
AFM Cantilever
Cantilever A
Beam
3 N/m (1 - 7 N/m)*
75 kHz (60 - 90 kHz)*
225 µm (215 - 235 µm)*
28 µm (23 - 33 µm)*
3 µm (2 - 4 µm)*
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