ElectriTap190-G (AFM 探针)

Application: Tapping, Intermittent Contact and electric modes such as: 

• Scanning Capacitance Microscopy (SCM)

• Electrostatic Force Microscopy (EFM)

• Kelvin Probe Force Microscopy (KPFM)

 

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

BudgetSensors' Tap190-G features a longer cantilever and it is meant as an alternative to BudgetSensors' Tap300 probes series, when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series.

 

Coating

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip

SHAPE
Rotated
HEIGHT
17 µm 
(15 - 19 µm)*
SETBACK
15 µm 
(10 - 20 µm)*
RADIUS
< 25 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

 

 

AFM Cantilever

Cantilever A
 Beam
 48 N/m (28 - 75 N/m)*
 190 kHz (160 - 220 kHz)*
 225 µm (215 - 235 µm)*
 38 µm (33 - 43 µm)*
 7 µm (6 - 8 µm)*
说明 档案大小 下载
budgetsensors 探针型录 123KB
型号 概述 询价数量