ElectriMulti75-G (AFM 探针)
Application:
- scanning capacitance microscopy (SCM)
- electrostatic force microscopy (EFM)
- Kelvin probe force microscopy (KFM)
- scanning probe lithography
Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM).
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
Coating
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.
AFM Tip
SHAPE
Rotated
HEIGHT
17 µm
(15 - 19 µm)*
(15 - 19 µm)*
SETBACK
15 µm
(10 - 20 µm)*
(10 - 20 µm)*
RADIUS
< 25 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
AFM Cantilever
Cantilever A
Beam
3 N/m (1 - 7 N/m)*
75 kHz (60 - 90 kHz)*
225 µm (215 - 235 µm)*
28 µm (23 - 33 µm)*
3 µm (2 - 4 µm)*
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