Contact-G (AFM 探针)
Application: Contact Mode
Monolithic silicon AFM probe for contact mode and lateral force mode operation.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!
Coating
Uncoated
AFM Tip
SHAPE
Rotated
HEIGHT
17 µm
(15 - 19 µm)*
(15 - 19 µm)*
SETBACK
15 µm
(10 - 20 µm)*
(10 - 20 µm)*
RADIUS
< 10 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
AFM Cantilever
Cantilever A
Beam
0.2 N/m (0.07 - 0.4 N/m)*
13 kHz (9 - 17 kHz)*
450 µm (440 - 460 µm)*
50 µm (45 - 55 µm)*
2 µm (1 - 3 µm)*
| 型号 | 概述 | 询价数量 |
|---|