KRC-HMC-100

CRM for the calibration of high magnification(AFM/SEM)

KRC-NSC-100

CRM for the Calibration of Nano Step-height(AFM)

KRC-ATC-200

CRM for the characterization of AFM tip

KRC-TSC-200

CRM for the Checking of Tip Shape

KRC-SSRM-100

CRM for the characterization of SSCM

KRC-NTC-HfO2

CRM for thickness measurement of nm oxide film

KRC-MLF

Multiple layer thin film CRM for depth profiling